GOF ECO · DFT-aware closure

Close the functional ECO without breaking test.

GOF helps account for scan chains, DFT constraints, lockup logic, and test-mode behavior while producing the netlist ECO and verification evidence your flow requires.

Discuss your DFT-aware ECO →

A functionally correct patch can still be a test failure

Netlist ECOs often touch reset, set, clock, scan, and test-mode logic. Treating those signals as ordinary logic can disconnect a scan chain, select the wrong equivalent signal, or produce a patch that fails downstream test checks.

GOF supports an ECO flow that makes DFT constraints explicit, preserves scan-aware intent, and gives engineers script-level control when a difficult case needs a targeted fix.

Typical cases

  • Scan-chain preservation
  • DFT constraint setup
  • Reset / set flop changes
  • Lockup and scan-output ECOs
  • DFT DRC and debug

A practical DFT-aware ECO flow

  1. Describe the functional change and test constraints. Identify scan, test-mode, clock, reset, and observation requirements before generating the patch.
  2. Generate or script the ECO. Use automatic ECO for the broad change and script mode for targeted operations such as scan stitching or lockup insertion.
  3. Check the result. Review the ECO and apply the required LEC, DFT, and downstream signoff checks before handoff.
Have a difficult reset/set, scan, or DFT constraint case? A short evaluation discussion is often the fastest way to determine whether GOF can produce a safe patch for the actual netlist and library context.

Evaluate a DFT-aware ECO → Read the DFT-friendly ECO detail


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